Abstract: In industrial micro-vision systems, challenges like mounting parallelism, mechanical vibration, and thermal drift often cause frequent and non-uniform defocus, which degrades traditional ...
Abstract: A fast analysis method for large finite arrays is proposed, which directly employs the near-field Huygens surface data of an isolated element instead of its full structural model. By ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results