EDN

Inspecting the wafer test

Wafer inspection has become a critical part of the semiconductor manufacturing process. Inspections performed after wafer test can analyze the marks left by probe cards to ensure that the test process ...
Semiconductor Engineering

Managing Wafer Retest

Every wafer test touch-down requires a balance between a good electrical contact and preventing damage to the wafer and probe card. Done wrong, it can ruin a wafer and the customized probe card and ...
Semiconductor Engineering

Need For KGD Drives Singulated Die Screening

The move to multi-die packaging is driving chipmakers to develop more cost-effective ways to ensure only known-good die are integrated into packages, because the price of failure is significantly ...
AZOM

The Trends Shaping Semiconductor Wafer Manufacturing

In this interview, Dr. Chady Stephan, PhD, the Applied Markets Leader at PerkinElmer, talks to AZoM about the current trends shaping semiconductor wafer manufacturing. A semiconductor is a material ...
Business Wire

Keysight Unveils 3kV High Voltage Wafer Test System for Power Semiconductors

Increased productivity and efficiency with one-pass test enabled by a high-voltage switching matrix Designed to enhance the safety of operators and equipment; complies with regulations SANTA ROSA, ...
EDN

Waveform generators and their role in IC testing

Semiconductors are the essential component fueling the growth of industries such as automotive, renewable energy, communications, information technology, defense, and consumer electronics. The rise of ...
Optics

Singapore-Taiwan duo collaborate on silicon photonics wafer testing

CompoundTek, the silicon photonics wafer foundry based in Singapore, has agreed a strategic collaboration with Taiwan's STAr Technologies that will aim to speed the technology’s move to large-scale ...
Nasdaq

Aehr Receives First Order for FOX(TM) Wafer Level Test and Burn-in System to be used for Gallium Nitride Semiconductor Engineering and Qualification

FREMONT, CA / ACCESSWIRE / December 14, 2023 / Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received an initial customer ...
Morningstar

Aehr Test Systems Announces Wafer Level Burn-in and Test Application Evaluation Order from Leading AI Processor Supplier

FREMONT, CA / ACCESS Newswire / August 26, 2025 / Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received a purchase order ...
AZOM

The Importance of Surface Charge at the Wafer-Water Interface for Wet-Chemical Processes

When we refer to surface charge analysis, we consider the charge at the interface between a material and a surrounding aqueous solution. With respect to the semiconductor field, knowing the charge at ...
Nasdaq

New SmartMatrix™ 3000XP Probe Card Lowers DRAM Test Costs by More than 25%

LIVERMORE, Calif., May 29, 2020 (GLOBE NEWSWIRE) -- FormFactor, Inc. (NASDAQ:FORM), a leading semiconductor test and measurement supplier, today announced the release of the SmartMatrix 3000XP probe ...