Medicine Buffalo

Statistical Process Control (SPC)

This asynchronous course addresses the basic theory behind Statistical Process Control (SPC), a method used in monitoring and controlling the quality of a process through statistical analysis to ...
Semiconductor Engineering

Process Variation Analysis of Device Performance Using Virtual Fabrication

How to avoid wafer-based testing during early technology development using a model to determine the optimal Si recess depth target and process window prior to source/drain epitaxy. A new methodology ...
Electronic Design

Role of statistical process control in semiconductor yield management

There is a boom in the volume of semiconductor devices being manufactured, and the boom is primarily credited to the proliferation of Internet of Things (IoT)-based devices in our daily lives. IoT ...
Semiconductor Engineering

Process Variation Analysis Of Device Performance Using Virtual Fabrication — Methodology Demonstrated On A CMOS 14-nm FinFET Vehicle

A new methodology to assess the impact of fabrication inherent process variability on 14-nm fin field effect transistor (FinFET) device performance. August 18th, 2021 - By: Coventor A new methodology ...
Phys.org

Process variation threatens to slow down and even pause chip miniaturization

For past several decades, the processor industry has enjoyed the benefits of chip miniaturization and the exponential increase in the number of on-chip transistors as predicted by Moore's law. However ...