AZoNano

Using SEM for Structural Analysis in Nanomaterials

Unlike optical microscopy, SEM does not rely on light waves but instead uses a beam of electrons to interact with materials, enabling magnifications up to 300,000× and resolutions approaching 1 nm. 1 ...
AZOM

Forensic Insights: Analyzing Glass Particles from Smartphone Damage using SEM, EDS, and Micro-CT

Locard’s exchange principle, which states that “every contact leaves a trace” drives the concept of “trace evidence” in the forensic sciences. Trace evidence is usually classed as fine particles, ...
AZoNano

EDS Analysis at the Nano-scale in an SEM

The interaction volume of a characteristic X-Ray emission can be seen in Figure 1. Typical EDS analysis in an SEM is carried out at relatively high energy (greater than 10 kV), which results in a vast ...
AZOM

FusionScope® - Integrated AFM, SEM, and EDS

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure FusionScope is a user-friendly platform ...