The traditional approach to moving scan test data from chip-level pins to core-level scan channels is under pressure due to the dramatic rise in design size, design complexity, and test adaptation. To ...

Maybe you should try boundary scan testing now that your continuity buzzer has died. Most engineers are familiar with the theory of boundary scan testing, but what about having actual hands-on ...

As chips become more heterogeneous with more integrated functionality, testing them presents increasing challenges — particularly for high-speed system-on-chip (SoC) designs with limited test pin ...

Zetacon Corporation designs and manufactures advanced power-control systems in hardware and software. Our products and technologies range from motor drives to power supplies, digital audio with ...

This is the second part of a two-part discussion (Part 1 appeared in August) in which the author considers fault-coverage analysis and simulation for full-scan testing of ASIC designs. These elements ...

Scan network security and attack mitigation play a pivotal role in safeguarding integrated circuits (ICs) and networked devices from unauthorised access, data extraction, and side‐channel attacks.