Designs with LogicBIST exhibit random pattern resistance because of the random nature of LBIST vectors, thus leading to low fault coverage. To handle this, we insert test points with the help of ...

[Nicholas Murray]’s Composite Test Pattern Generator is a beautifully-made, palm-sized tool that uses an ESP32-based development board to output different test patterns in PAL/NTSC. If one is checking ...

Download this article in PDF format. Finding the right balance among test cost, test quality, and data collection for running diagnosis requires consideration of several competing factors. Luckily ...

Some strange mathematical sequences are always whole numbers — until they’re not. The puzzling patterns have revealed ties to graph theory and prime numbers, awing mathematicians. Simple, yes, but ...

Here's a common situation for memory designers: your RAM or flash has been fabricated, but the yield is lower than you would like. Maybe there is an odd correlation between a particular failure mode ...