How the challenges of electric-motor control design can be overcome using digital twins in all design and test phases. How automated testing within a continuous and integrated toolchain is able to ...

Analog fault simulation in mixed‐signal circuits is a critical tool for ensuring the robustness and reliability of systems that integrate both analogue and digital components. This field addresses the ...

System-level testing is becoming essential for testing complex and increasingly heterogeneous chips, driven by rising demand for reliable parts in safety- and mission-critical applications. More and ...

The transition to the 2nm technology node introduces unprecedented challenges in Automated Test Equipment (ATE) bring-up and manufacturability. As semiconductor devices scale down, the complexity of ...

ATPG targets faults at IC-gate boundaries, but 50% of defects are located within cells. Learn how cell-aware ATPG and user-defined fault models help to ferret out these hard-to-squash bugs.

NATICK, Mass.--(BUSINESS WIRE)--MathWorks unveiled Release 2023b (R2023b) of the MATLAB® and Simulink® product families today. R2023b introduces two new products and several major updates that provide ...

Simulation technology is increasingly being utilised within the automotive space, saving time, money and allowing for simulated repeats of real-world scenarios again and again. Advanced Micro Devices ...