About a dozen years ago, the world of test had reached an economic impasse: most digital designs had become sufficiently complex that standard scan testing techniques were no longer cost-effective.

Test compression technology was invented to address the problem of escalating test-pattern size. Compression allows more test vectors to be applied to an IC in a shorter time and with fewer tester ...

"Hearst Magazines and Yahoo may earn commission or revenue on some items through these links." When you take a long-haul flight or spend your whole shift standing, you may notice swollen ankles and ...

Want to know how healthy or unhealthy your engine really is? Get yourself a compression tester and find out. Despite how complex many modern vehicles are, you can do many common repair and maintenance ...

For the past five years, the cost of test has prevailed as the hottest topic in test. During this period, automated test equipment (ATE) has made a dramatic move towards low-cost design for test (DFT) ...

The purpose of your engine is to compress fuel and air and then ignite it, creating heat energy that then makes mechanical motion. If your engine can't compress the air and fuel properly, the engine ...

The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...

Compression tests are used to characterize various compressive properties such as the compression modulus and compressive strength. They are performed on fiber-reinforced composites with ...

Lithium-ion batteries are a kind of rechargeable battery that is charged or discharged through desorption or insertion of lithium ions (Li +) from or into the active material structure. In recent ...

Semiconductor chips have been evolving to meet the demands of rapidly transforming applications, and so has the test technology to meet the test goals of those chips. Going back two decades or so, the ...

Recent and continuing trends in the semiconductor industry pose challenges to IC test-data volumes, test application times, and test costs. The industry has thus far succeeded in containing test costs ...