To address the challenges of limited detection accuracy for small targets in complex backgrounds and the difficulty in model deployment due to a large number of parameters in steel surface defect ...
Object detection is a critical task in computer vision, involving the identification and localization of objects within an image 1. Object detection algorithms typically extract meaningful results ...
A material may appear flawless on the surface yet fail to function properly. The cause lies in structural defects hidden ...
Researchers in China have developed a novel deep learning model to detect defects in photovoltaic panels. The approach leverages high-resolution visible light imaging to identify defects using an ...
“Semiconductor lithography inspection requires reliable detection of small pattern defects such as bridge, burr, pinch, and contamination. In this study, we propose a two-stage vision-language ...
AI plays a role in improving defect capture rate and distinguishing between yield-killing and nuisance defects. New developments in wafer edge inspection are proving essential to bonded wafer yields.